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1

How business strategy in non-financial firms moderates the curvilinear effects of corporate social responsibility and irresponsibility on corporate financial performance

Chen, Chung-Jen, Guo, Ruey-Shan, Hsiao, Yung-Chang, Chen, Kuo-Liang

Journal:

Journal of Business Research

Year:

2018

Language:

english

File:

PDF, 1.00 MB

english, 2018

2

[IEEE 2000 Semiconductor Manufacturing Technology Workshop - Hsinchu, Taiwan (14-15 June 2000)] 2000 Semiconductor Manufacturing Technology Workshop (Cat. No.00EX406) - Run-to-run control schemes for CMP process subject to deterministic drifts

Ruey-Shan Guo,, Argon Chen,, Jin-Jung Chen,

Year:

2000

Language:

english

File:

PDF, 581 KB

english, 2000

3

A multi-category inter-purchase time model based on hierarchical Bayesian theory

Journal:

Expert Systems with Applications

Year:

2009

Language:

english

File:

PDF, 298 KB

english, 2009

4

Decision tree based control chart pattern recognition

Wang, Chih-Hsuan, Guo, Ruey-Shan, Chiang, Ming-Huang, Wong, Jehn-Yih

Journal:

International Journal of Production Research

Year:

2008

Language:

english

File:

PDF, 348 KB

english, 2008

5

Age-based double EWMA controller and its application to CMP processes

Chen, A., Ruey-Shan Guo,

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2001

Language:

english

File:

PDF, 199 KB

english, 2001

6

[IEEE 1997 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings - San Francisco, CA, USA (6-8 Oct. 1997)] 1997 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat. No.97CH36023) - A cost-effective methodology for a run-by-run EWMA controller

Ruey-Shan Guo,, Li-Shia Huang,, Argon chen,, Jin-Jung Chen,

Year:

1997

Language:

english

File:

PDF, 356 KB

english, 1997

7

Partner selection model for design chain collaboration

Chen, Jia-Ying, Chiang, David Ming-Huang, Guo, Ruey-Shan

Journal:

International Journal of Production Research

Year:

2013

Language:

english

File:

PDF, 430 KB

english, 2013

8

The D-Day, V-Day, and bleak days of a disruptive technology: A new model for ex-ante evaluation of the timing of technology disruption

Chen, Chialin, Zhang, Jun, Guo, Ruey-Shan

Journal:

European Journal of Operational Research

Year:

2015

Language:

english

File:

PDF, 869 KB

english, 2015

9

Optimal supply chain configurations in semiconductor manufacturing

Chiang, David, Guo, Ruey-Shan, Chen, Argon, Cheng, Meng-Tse, Chen, Cheng-Bang

Journal:

International Journal of Production Research

Year:

2007

Language:

english

File:

PDF, 429 KB

english, 2007

10

Strategy, capabilities, and business group performance

Wang, Shan-Huei, Chen, Chung-Jen, Guo, Andy Ruey-Shan, Lin, Ya-Hui

Journal:

Management Decision

Year:

2019

Language:

english

File:

PDF, 249 KB

english, 2019

11

Virtual fab: an enabling framework and dynamic manufacturing service provision mechanism

Yea-Huey Su, Ruey-Shan Guo, Shi-Chung Chang

Journal:

Information & Management

Year:

2005

Language:

english

File:

PDF, 998 KB

english, 2005

12

A WIP-based exception-management model for integrated circuit back-end production processes

Ruey-Shan Guo, David M. Chiang, Fan-Yun Pai

Journal:

The International Journal of Advanced Manufacturing Technology

Year:

2007

Language:

english

File:

PDF, 191 KB

english, 2007

13

Retailer’s optimal sourcing strategy by using one major supplier and one emergent supplier

David M. Chiang, Ruey-Shan Guo, Fan-Yun Pai

Journal:

Optimization Letters

Year:

2011

Language:

english

File:

PDF, 237 KB

english, 2011

14

An EWMA-based process mean estimator with dynamic tuning capability

Ruey-Shan Guo, Jin-Jung Chen

Journal:

IIE Transactions

Year:

2002

Language:

english

File:

PDF, 522 KB

english, 2002

15

[IEEE 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings - Santa Clara, CA, USA (11-13 Oct. 1999)] 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat No.99CH36314) - Run-to-run control of CMP process considering aging effects of pad and disc

Argon Chen,, Ruey-Shan Guo,, Chou, Y.L., Lin, C.L., Jowei Dun,, Wu, S.A.

Year:

1999

Language:

english

File:

PDF, 233 KB

english, 1999

16

SHEWMA: an end-of-line SPC scheme using wafer acceptance test data

Chih-Min Fan,, Ruey-Shan Guo,, Shi-Chung Chang,, Chih-Shih Wei,

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2000

Language:

english

File:

PDF, 355 KB

english, 2000

17

[IEEE 2000 Semiconductor Manufacturing Technology Workshop - Hsinchu, Taiwan (14-15 June 2000)] 2000 Semiconductor Manufacturing Technology Workshop (Cat. No.00EX406) - SHEWMAC: an end-of-line SPC scheme via exponentially weighted moving statistics

Chih-Min Fan,, Shi-Chung Chang,, Ruey-Shan Guo,, Hui-Hung Kung,, Jyh-Cheng You,, Hsin-Pai Chen,, Lin, S., Chih-Shih Wei,

Year:

2000

Language:

english

File:

PDF, 654 KB

english, 2000

18

[IEEE 2000 Semiconductor Manufacturing Technology Workshop - Hsinchu, Taiwan (14-15 June 2000)] 2000 Semiconductor Manufacturing Technology Workshop (Cat. No.00EX406) - An effective SPC approach to monitoring semiconductor quality data with multiple variation sources

Argon Chen,, Ruey-Shan Guo,, Pei-Chen Yeh,

Year:

2000

Language:

english

File:

PDF, 253 KB

english, 2000

19

[IEEE 1997 2nd International Workshop on Statistical Metrology - Kyoto, Japan (8 June 1997)] 1997 2nd International Workshop on Statistical Metrology - EWMA/SD: an end-of-line SPC scheme to monitor sequence-disordered data [semiconductor manufacturing]

Chih-Min Fan,, Ruey-Shan Guo,, Shi-Chung Chang,

Year:

1997

Language:

english

File:

PDF, 389 KB

english, 1997

20

[IEEE IEEE/SEMI 1996 Advanced Semiconductor Manufacturing Conference and Workshop. Theme-Innovative Approaches to Growth in the Semiconductor Industry. ASMC 96 Proceedings - Cambridge, MA, USA (12-14 Nov. 1996)] IEEE/SEMI 1996 Advanced Semiconductor Manufacturing Conference and Workshop. Theme-Innovative Approaches to Growth in the Semiconductor Industry. ASMC 96 Proceedings - Abnormal trend detection of sequence-disordered data using EWMA method [wafer fabrication]

Jr-Min Fan,, Ruey-Shan Guo,, Shi-Chung Chang,, Jian-Huei Lee,

Year:

1996

Language:

english

File:

PDF, 562 KB

english, 1996

21

An EWMA-based process mean estimator with dynamic tuning capability

GUO, RUEY-SHAN, CHEN, JTN-JUNG

Journal:

IIE Transactions

Year:

2002

Language:

english

File:

PDF, 434 KB

english, 2002

22

[IEEE 2006 International Symposium on Semiconductor Manufacturing (ISSM) - Tokyo, Japan (2006.09.25-2006.09.27)] 2006 IEEE International Symposium on Semiconductor Manufacturing - A Quadratic Goal Programming Model and Sensitivity Analysis for Semiconductor Supply Chain

Chiang, David, Guo, Ruey-Shan, Chen, Argon, Chen, Cheng-Bang

Year:

2006

Language:

english

File:

PDF, 1.87 MB

english, 2006

23

[IEEE 1998 Semiconductor Manufacturing Technology Workshop - Hsinchu, Taiwan (16-17 June 1998)] 1998 Semiconductor Manufacturing Technology Workshop (Cat. No.98EX133) - A conceptual framework for manufacturing service provisioning by virtual fabs

Yea-Huey Su,, Ruey-Shan Guo,, Shi-Chung Chang,

Year:

1998

Language:

english

File:

PDF, 741 KB

english, 1998

24

[IEEE A Unifying Discipline for Melting the Boundaries Technology Management: - Portland, OR, USA (31 July-4 Aug., 2005)] A Unifying Discipline for Melting the Boundaries Technology Management: - Historically explore on the patterns of business model for silicon intellectual property (ip) providers in the semiconductor industry

Yea-Huey Su,, Ruey-Shan Guo,, Wen-Yuan Hsieh,

Year:

2005

Language:

english

File:

PDF, 331 KB

english, 2005

25

[IEEE 2003 IEEE International Symposium on Semiconductor Manufacturing. Conference Proceedings - San Jose, CA, USA (30 Sept.-2 Oct. 2003)] 2003 5th International Conference on ASIC. Proceedings (IEEE Cat. No.03TH8690) - Integrated yield-mining solution with enhanced electrical test data correlation

Chih-Min Fan,, Ruey-Shan Guo,, Chen, A., Hon, A., Wei, J., Mingchu King,

Year:

2003

Language:

english

File:

PDF, 277 KB

english, 2003

26

[IEEE 1998 Semiconductor Manufacturing Technology Workshop - Hsinchu, Taiwan (16-17 June 1998)] 1998 Semiconductor Manufacturing Technology Workshop (Cat. No.98EX133) - A dynamic binding model for service creation in virtual fab

Shi-Chung Chang,, Tsung-Lian Chou,, Ruey-Shan Guo,, Yea-Huey Su,, Ling-Ling Lu,, I-Chang Lai,

Year:

1998

Language:

english

File:

PDF, 342 KB

english, 1998

27

[Ultra Clean Soc ISSM2000. Ninth International Symposium on Semiconductor Manufacturing - Tokyo, Japan (26-28 Sept. 2000)] Proceedings of ISSM2000. Ninth International Symposium on Semiconductor Manufacturing (IEEE Cat. No.00CH37130) - Realizing dynamic manufacturing service provisioning mechanism in order commitment service

Shi-Chung Chang,, Ruey-Shan Guo,, Yea-Huey Su,, Yi-Chang Lai,

Year:

2000

Language:

english

File:

PDF, 451 KB

english, 2000

28

[IEEE 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings - Santa Clara, CA, USA (11-13 Oct. 1999)] 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat No.99CH36314) - Function-based cost modeling for wafer manufacturing and its application to strategic management

Ruey-Shan Guo,, Argon Chen,, Pei-Lan Lin,, Yih-Cheng Shih,

Year:

1999

Language:

english

File:

PDF, 281 KB

english, 1999

29

[IEEE 2007 International Symposium on Semiconductor Manufacturing - Santa Clara, CA, USA (2007.10.15-2007.10.17)] 2007 International Symposium on Semiconductor Manufacturing - Evolutionary business models and inter-firm engineering processes between the foundry and fabless in the semiconductor industry

Ruey-Shan Guo,, Yea-Huey Su,, Su-Fen Chiu,, Fan-Yun Pai,, Chung-Pin Yeh,

Year:

2007

Language:

english

File:

PDF, 955 KB

english, 2007

30

[IEEE ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005. - San Jose, CA, USA (2005.09.13-2005.09.15)] ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005. - Pattern of vertical engineering collaboration between foundry and design service provider

Yea-Huey Su,, Ruey-Shan Guo,, Chia-Hsien Hsiao,

Year:

2005

Language:

english

File:

PDF, 258 KB

english, 2005

31

[IEEE 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings - Santa Clara, CA, USA (11-13 Oct. 1999)] 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat No.99CH36314) - Modeling and optimization of wafer-level spatial uniformity with the use of rational subgrouping

Ruey-Shan Guo,, Argon Chen,, Cheewee Liu,, Lin, A., Lan, M.

Year:

1999

Language:

english

File:

PDF, 301 KB

english, 1999

32

[IEEE Nineteenth IEEE/CPMT International Electronics Manufacturing Technology Symposium - Austin, TX, USA (14-16 Oct. 1996)] Nineteenth IEEE/CPMT International Electronics Manufacturing Technology Symposium - Intelligent process diagnosis based on end-of-line electrical test data

Ruey-Shan Guo,, Cheng-Kai Tsai,, Jian-Huei Lee,, Shi-Chung Chang,

Year:

1996

Language:

english

File:

PDF, 727 KB

english, 1996

33

[IEEE 2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. - San Jose, CA, USA (8-10 Oct. 2001)] 2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203) - Data mining and fault diagnosis based on wafer acceptance test data and in-line manufacturing data

Chih-Min Fan,, Ruey-Shan Guo,, Chen, A., Kuo-Ching Hsu,, Chih-Shih Wei,

Year:

2001

Language:

english

File:

PDF, 350 KB

english, 2001

34

Improved customer satisfaction with a hybrid dispatching rule in semiconductor back-end factories

Chiang, David M., Guo, Ruey-Shan, Pai, Fan-Yun

Journal:

International Journal of Production Research

Year:

2008

Language:

english

File:

PDF, 217 KB

english, 2008

35

[IEEE 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings - Santa Clara, CA, USA (11-13 Oct. 1999)] 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat No.99CH36314) - SHEWMAC: an end-of-line SPC scheme for joint monitoring of process mean and variance

Chih-Min Fan,, Shi-Chung Chang,, Ruey-Shan Guo,, Hui-Hung Kung,, Jyh-Cheng You,, Hsin-Pai Chen,, Lin, S., Wei, J.

Year:

1999

Language:

english

File:

PDF, 325 KB

english, 1999

36

[IEEE 2006 International Symposium on Semiconductor Manufacturing (ISSM) - Tokyo, Japan (2006.09.25-2006.09.27)] 2006 IEEE International Symposium on Semiconductor Manufacturing - Evolutionary Engineering Collaboration for DFM/DFY Solutions between Foundry and EDA Tool Vendor

Su, Yea-Huey, Guo, Ruey-Shan, Chang, Hsiao-Huan

Year:

2006

Language:

english

File:

PDF, 1.60 MB

english, 2006

37

[IEEE 2004 Semiconductor Manufacturing Technology Workshop - Hsinchu, Taiwan (9-10 Sept. 2004)] 2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846) - Inter-firm collaboration mechanism in process development and product design between foundry and fabless design house

Yea-Huey Su,, Ruey-Shan Guo,, Shi-Chung Chang,

Year:

2004

Language:

english

File:

PDF, 310 KB

english, 2004

38

Forward Echelon-Based Inventory Monitoring in a Semiconductor Supply Chain

Ruey-shan Guo, Ming-huang Chiang, Hon-wen Lin, Jia-ying Chen

Year:

2010

Language:

english

File:

PDF, 637 KB

english, 2010

39

[IEEE 2006 International Symposium on Semiconductor Manufacturing (ISSM) - Tokyo, Japan (2006.09.25-2006.09.27)] 2006 IEEE International Symposium on Semiconductor Manufacturing - Supply Chain Inventory Control in Semiconductor Manufacturing

Guo, Ruey-Shan, Chiang, David, Yang, Po-Chun

Year:

2006

Language:

english

File:

PDF, 1.52 MB

english, 2006

40

[IEEE 2007 International Symposium on Semiconductor Manufacturing - Santa Clara, CA, USA (2007.10.15-2007.10.17)] 2007 International Symposium on Semiconductor Manufacturing - Forward echelon-based inventory monitoring in semiconductor supply chain

Ruey-Shan Guo,, David Chiang,, Hong-Wen Lin,, Mei-Shang Guo,

Year:

2007

Language:

english

File:

PDF, 1.18 MB

english, 2007

41

[IEEE International Symposium on Semiconductor Manufacturing, Extended Abstracts of ISSM - Tokyo, Japan (June 21-22, 1994)] International Symposium on Semiconductor Manufacturing, Extended Abstracts of ISSM - Agile Flow Control In Semiconductor Manufacturing: Simulation And Animation Demonstration

Ruey-Shan Guo,, Griffin, R., Slama, M.

Year:

1994

Language:

english

File:

PDF, 362 KB

english, 1994

42

[IEEE International Symposium on Semiconductor Manufacturing, Extended Abstracts of ISSM - Tokyo, Japan (June 21-22, 1994)] International Symposium on Semiconductor Manufacturing, Extended Abstracts of ISSM - Results Of An Implant Masking Integrated Workcall In A Development Facility

Griffin, R., Ruey-Shan Guo,, Slama, M.

Year:

1994

Language:

english

File:

PDF, 393 KB

english, 1994

43

[IEEE 2000 Semiconductor Manufacturing Technology Workshop - Hsinchu, Taiwan (14-15 June 2000)] 2000 Semiconductor Manufacturing Technology Workshop (Cat. No.00EX406) - Application of dynamic manufacturing service provisioning mechanism to delivery commitment

Yea-Huey Su,, Shi-Chung Chang,, Ruey-Shan Guo,, Yi Chang Lai,

Year:

2000

Language:

english

File:

PDF, 806 KB

english, 2000

44

A self‐tuning run‐by‐run process controller for processes subject to random disturbances

Guo, Ruey‐Shan, Chen, Jin‐Jung, Chen, Argon, Lu, Shui‐Shong

Journal:

Journal of the Chinese Institute of Engineers

Year:

1999

Language:

english

File:

PDF, 1.09 MB

english, 1999

45

First-mover strategy, resource capacity alignment, and new product performance: a framework for mediation and moderation effects

Hsiao, Yung-Chang, Chen, Chung-Jen, Guo, Ruey-Shan, Hu, Kae-Kuen

Journal:

Year:

2015

Language:

english

File:

PDF, 302 KB

english, 2015

46

[IEEE 2018 Portland International Conference on Management of Engineering and Technology (PICMET) - Honolulu, HI (2018.8.19-2018.8.23)] 2018 Portland International Conference on Management of Engineering and Technology (PICMET) - The Strategic Choice for Applying Government Subsidized R&D: The Relationship among Organizational Resources and Capabilities, Strategy, and Performance

Chen, Chung-Jen, Guo, Ruey-Shan, Hsiao, Yung-Chang, Hu, Kae-Kuen

Year:

2018

File:

PDF, 10 KB

2018

47

Strategy, capabilities, and business group performance

Wang, Shan-Huei, Chen, Chung-Jen, Guo, Andy Ruey-Shan, Lin, Ya-Hui

Journal:

Management Decision

Year:

2019

File:

PDF, 249 KB

2019

48

Virtual vs physical platform: organizational capacity and slack, strategic decision and firm performance

Lee, Hang, Hsiao, Yung-Chang, Chen, Chung-Jen, Guo, Ruey-Shan

Journal:

Journal of Business & Industrial Marketing

Year:

2020

File:

PDF, 298 KB

2020

49

Parent-subsidiary linkage: How resource commitment and resource similarity influence firm performance

Chen, Chung-Jen, Lin, Ya-Hui, Wang, Shan-Huei, Guo, Ruey-Shan

Journal:

Asia Pacific Journal of Management

Year:

2020

File:

PDF, 1.11 MB

2020

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